Measuring the size of buried quantum dots using phonons

Physica B: Condensed Matter

Volumn 263-264, Issue , 1999, Pages 514-516

  Hawker, P ^a   Kent, A J ^a   Henini, M ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

PHONONS; SURFACE PHENOMENA;

PHONON REFLECTION;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0032689745     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)01251-4     Document Type: Article

References (1)

1. F. Gindele, O. Wind, U. Woggen, in: M. Scheffler, R. Zimmermann (Eds.), Proc. 23rd Int. Conf. Physics of Semiconductors, Berlin, World Scientific, Singapore, 1996, p. 1465.