Electrochromic performance of sol-gel deposited WO3-V2O5 films

Thin Solid Films

Volumn 349, Issue 1, 1999, Pages 205-211

  Ozer, N ^a   Lampert, C M ^b  

^a ISTANBUL UNIVERSITY   (Turkey)

^b Star Science   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CYCLIC VOLTAMMETRY; DEPOSITION; ELECTROCHEMICAL ELECTRODES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; SCANNING ELECTRON MICROSCOPY; SOL-GELS; TUNGSTEN COMPOUNDS; VANADIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROCHEMICAL INSERTION; ELECTROCHROMIC ELECTRODES; SPIN COATING METHOD;

THIN FILMS;

EID: 0032689340     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00144-3     Document Type: Article

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