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Volumn 48, Issue 1, 1999, Pages 81-84

Crack initiation in machining monocrystalline silicon

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLENESS; COMPUTER SIMULATION; CRACK INITIATION; CRYSTAL DEFECTS; MATHEMATICAL MODELS; METAL CUTTING; MOLECULAR DYNAMICS; SILICON; STRESS CONCENTRATION;

EID: 0032689334     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)63136-9     Document Type: Article
Times cited : (42)

References (9)
  • 1
    • 0026154663 scopus 로고
    • Ductile-Regime Grinding; A New Technology for Machining Brittle Matenals
    • Bifano,T.G., Dow,T.G., Scattergood,R.O., 1991, Ductile-Regime Grinding; A New Technology for Machining Brittle Matenals, Trans. ASME: J.Eng.for Industry, 113,pp 184-489.
    • (1991) Trans. ASME: J.Eng.for Industry , vol.113 , pp. 184-489
    • Bifano, T.G.1    Dow, T.G.2    Scattergood, R.O.3
  • 2
    • 0019285243 scopus 로고
    • The Correlation of Fracture Transitions
    • Puttick,K.E., 1980, The Correlation of Fracture Transitions, J.Phys.,D: Appl. Phys., 13, pp.2249-2267.
    • (1980) J.Phys.,D: Appl. Phys. , vol.13 , pp. 2249-2267
    • Puttick, K.E.1
  • 3
    • 0025889580 scopus 로고
    • A J-Integral Approach to Material Removal Mechanisms in Microcutting of Ceramics
    • Ueda,K. Sugita,T, Hiraga,H., 1991, A J-Integral Approach to Material Removal Mechanisms in Microcutting of Ceramics, Annals of the CIRP, 40,/1, pp.61-64.
    • (1991) Annals of the CIRP , vol.40 , Issue.1 , pp. 61-64
    • Ueda, K.1    Sugita, T.2    Hiraga, H.3
  • 4
    • 0029545770 scopus 로고
    • Observation on Polishing and Ultraprecision Machining of Semiconductor Substrate Materials
    • Venkatech,VC.,Inasaki,I.,Toenshof,H.K.,Nakagawa,T.,M arinescu,I.D., 1995, Observation on Polishing and Ultraprecision Machining of Semiconductor Substrate Materials, Annals of the CIRP, 44/2, pp.611-618.
    • (1995) Annals of the CIRP , vol.44 , Issue.2 , pp. 611-618
    • Venkatech, V.C.1    Inasaki, I.2    Toenshof, H.K.3    Nakagawa, T.4    Marinescu, I.D.5
  • 6
    • 0030689371 scopus 로고    scopus 로고
    • Brittle/Ductile Transition Phenomena Observed in Computer Simulations of Machining Defect-Free Monocrystalline Silicon
    • Inamura,T., Shimada.,S., Takezawa,N., Nakahara,N., 1997, Brittle/Ductile Transition Phenomena Observed in Computer Simulations of Machining Defect-Free Monocrystalline Silicon, Annals of the CIRP46/1,pp.31-34.
    • (1997) Annals of the CIRP , vol.46 , Issue.1 , pp. 31-34
    • Inamura, T.1    Shimada, S.2    Takezawa, N.3    Nakahara, N.4
  • 7
    • 0031116947 scopus 로고    scopus 로고
    • On Variable Scale Molecular Dynamics Simulation Based on Renormalization Technique
    • Inamura,T., Takezawa,N., Shamoto,S., 1997, On Variable Scale Molecular Dynamics Simulation Based on Renormalization Technique, Trans. JSME, 63,608,A, pp.858-863.
    • (1997) Trans. JSME , vol.63 , Issue.608 A , pp. 858-863
    • Inamura, T.1    Takezawa, N.2    Shamoto, S.3
  • 8
    • 16444366630 scopus 로고
    • New Empirical Approach for the Structure and Energy of Covalent System
    • Tersoff,J., 1988, New Empirical Approach for the Structure and Energy of Covalent System, Physical Review, B37, 12, pp.6991-7000.
    • (1988) Physical Review , vol.B37 , Issue.12 , pp. 6991-7000
    • Tersoff, J.1
  • 9
    • 0017266684 scopus 로고
    • The Significance of Dynamic Crack Behavior in Chip Formation
    • Iwata,K., Ueda,K. 1976, The Significance of Dynamic Crack Behavior in Chip Formation, Annals of the CIRP, 25/1, pp.65-70.
    • (1976) Annals of the CIRP , vol.25 , Issue.1 , pp. 65-70
    • Iwata, K.1    Ueda, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.