Analysis of thin layers and discontinuities

Optical and Quantum Electronics

Volumn 31, Issue 9, 1999, Pages 721-732

  Helfert, S F ^a   Pregla, R ^a  

^a UNIVERSITY OF HAGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; FINITE DIFFERENCE METHOD; INTERFACES (MATERIALS); LIGHT POLARIZATION; OPTICAL MATERIALS; THIN FILM DEVICES;

METHOD OF LINES; TRANSVERSE ELECTRIC/MAGNETIC (TE/TM) POLARIZATION;

OPTICAL WAVEGUIDES;

EID: 0032688545     PISSN: 03068919     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1006929303579     Document Type: Article

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