TOMS/ADEOS instrument characterization

IEEE Transactions on Geoscience and Remote Sensing

Volumn 37, Issue 3 II, 1999, Pages 1543-1549

  Krueger, Arlin J ^a   Jaross, Glen ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; OZONE LAYER; PROBABILITY; SATELLITE OBSERVATORIES; ULTRAVIOLET SPECTROMETERS;

ADVANCED EARTH OBSERVATION SATELLITES (ADEOS); INSTRUMENT ALBEDO CALIBRATION; TOTAL OZONE MAPPING SPECTROMETERS (TOMS); WAVELENGTH CALIBRATION;

REMOTE SENSING;

EID: 0032687478     PISSN: 01962892     EISSN: None     Source Type: Journal    
DOI: 10.1109/36.763265     Document Type: Article

References (12)