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Volumn 39, Issue 4, 1999, Pages 346-351
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Evaluation of heterogeneity in thickness of passive films on pure iron by scanning electrochemical microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
BORON COMPOUNDS;
CRYSTAL ORIENTATION;
ELECTRODES;
IRON;
MICROSCOPIC EXAMINATION;
PASSIVATION;
PH EFFECTS;
SUBSTRATES;
SCANNING ELECTROCHEMICAL MICROSCOPY (SECM);
PROTECTIVE COATINGS;
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EID: 0032687185
PISSN: 09151559
EISSN: None
Source Type: Journal
DOI: 10.2355/isijinternational.39.346 Document Type: Article |
Times cited : (36)
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References (36)
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