Development of a new crack identification method based on singular current field using differential thermography

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3700, Issue , 1999, Pages 369-376

  Sakagami, Takahide ^a   Kubo, Shiro ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; ELECTRIC CURRENTS; NONDESTRUCTIVE EXAMINATION; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

CRACK IDENTIFICATION METHOD; DIFFERENTIAL THERMOGRAPHY; INDUCED CURRENT; LOCK-IN THERMOGRAPHY; SINGULAR CURRENT FIELD;

THERMOGRAPHY (IMAGING);

EID: 0032687008     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)