Perovskite lead titanate PLD thin films: Study of oxygen incorporation by 18O tracing technique

Materials Chemistry and Physics

Volumn 59, Issue 2, 1999, Pages 114-119

  Chaoui, N ^a   Millon, E ^a   Muller, J F ^a   Ecker, P ^b   Bieck, W ^b   Migeon, H N ^b  

^a UNIVERSITÉ DE LORRAINE   (France)

^b Laboratoire d'Analyse Des Materiaux   (Luxembourg)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DEPOSITION; FERROELECTRIC MATERIALS; LASER ABLATION; LEAD COMPOUNDS; OXYGEN; PLATINUM; POLYCRYSTALLINE MATERIALS; PULSED LASER APPLICATIONS; RADIOACTIVE TRACERS; SECONDARY ION MASS SPECTROMETRY; THIN FILMS;

ISOTOPIC TRACING; LEAD TITANATE; PULSED LASER DEPOSITION (PLD);

DIELECTRIC FILMS;

EID: 0032686969     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(99)00051-6     Document Type: Article

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