Silicon clathrates: Synthesis and characterization

Materials Research Society Symposium - Proceedings

Volumn 507, Issue , 1999, Pages 483-486

  Ramachandran, Ganesh K ^a   Diefenbacher, Jason ^a   Sankey, Otto F ^a   Sharma, Renu ^a   Marzke, Robert F ^a   O'Keeffe, Michael ^a   Gryko, Jan ^a   McMillan, Paul F ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; HIGH RESOLUTION ELECTRON MICROSCOPY; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; SODIUM; X RAY CRYSTALLOGRAPHY;

RIETVELD PROFILE ANALYSIS; SILICON CLATHRATES;

SILICON COMPOUNDS;

EID: 0032686786     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)