Surface morphology of organic thin films

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 623-626

  Fraxedas, J ^a   Caro, J ^a   Santiso, J ^a   Figueras, A ^a   Gorostiza, P ^b   Sanz, F ^b  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^b UNIVERSITY OF BARCELONA   (Spain)

Author keywords

Atomic force microscopy; Morphology; Roughness and topography; Surface defects; Surface structure

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; MOLECULAR STRUCTURE; MORPHOLOGY; ORGANIC COMPOUNDS; SURFACE ROUGHNESS; SURFACE STRUCTURE; SURFACE TOPOGRAPHY; SURFACES; VAPOR DEPOSITION;

ALKALI HALIDE SUBSTRATES; ORGANIC THIN FILMS; P-NITROPHENYL NITRONYL NITROXIDE; SURFACE DEFECTS; TAPPING MODE ATOMIC FORCE MICROSCOPY; TETRATHIAFULVALENE TETRACYANOQUINODIMETHANE;

THIN FILMS;

EID: 0032686542     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00878-2     Document Type: Article

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