New grating photopolarimeter for the ellipsometric characterization of thin films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3738, Issue , 1999, Pages 166-172

  Masetti, E ^a   Krasilnikova, A ^a  

^a ENEA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIFFRACTION GRATINGS; ELLIPSOMETRY; FILM GROWTH; HELIUM NEON LASERS; POLARIMETERS; REFRACTIVE INDEX; THIN FILMS;

FOUR-DETECTOR PHOTOPOLARIMETERS;

OPTICAL FILMS;

EID: 0032685606     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (14)