HTS edge junction dependence on base electrode edge smoothness

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3354-3357

  Murduck, J ^a   Pettiette Hall, C L ^a   Hu, R ^a   Salazar, O ^a   McGerr, M ^a   Daly, K ^a   Luine, J ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; ELECTRIC CURRENTS; ELECTRODES; ELECTRON DEVICE MANUFACTURE; HIGH TEMPERATURE SUPERCONDUCTORS; MORPHOLOGY; SQUIDS; SUPERCONDUCTING FILMS; SURFACE PROPERTIES;

FILM SMOOTHNESS; HIGH TEMPERATURE SUPERCONDUCTOR EDGE JUNCTION; PULSED LASER DEPOSITION;

JOSEPHSON JUNCTION DEVICES;

EID: 0032685296     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783748     Document Type: Article

References (5)

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2. B. Hunt, M. Forrester, J. Talcacchio, R. Young and J. McCambridge, "High-Tc SNS Edge Junctions with Integrated YBa,Cu,O. Groundplanes," IEEE Trans, on Magnetics, Vol. 7, No. 2, p. 2936
3. G. Box, W. Hunter and J. Hunter, Statistics for Experimenters, John Wiley and Sons, 1978.
4. C. L. Pertiette-Hall, J. M. Murduck, J. F. Burch, M. Sergant, R. Hu, J. Cordromp, M. Luong and R. K. Ellis, "Characterization and Improvement of YBCO Multilayer Film Process for HTS Circuit Applications," IEEE Trans, on Magnetics, Vol. 7, No. 2, p. 2057
5. K. Saitoh, T Utagawa, and Y. Enomoto, A Phenomemological Model Analysis for Current Voltage Characteristics of Superconducting Weak Links ", Proceedings of the W International Symposium on Superconductivity, p. 1129, 1997.