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Volumn 9, Issue 8, 1998, Pages 672-675

Characterization of particle motion for polishing and texturing under AC field by using particle dispersion type ER fluid

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DISPERSIONS; ELECTRIC FIELD EFFECTS; MICROSCOPIC EXAMINATION; PARTICLES (PARTICULATE MATTER); POLISHING; RHEOLOGY; VISCOSITY OF LIQUIDS;

EID: 0032684502     PISSN: 1045389X     EISSN: None     Source Type: Journal    
DOI: 10.1177/1045389X9800900815     Document Type: Article
Times cited : (16)

References (4)
  • 2
    • 33749278467 scopus 로고
    • Japanese Patent (submitted)
    • K. Nuri and K. Itoh, Japanese Patent (submitted) 1995.
    • (1995)
    • Nuri, K.1    Itoh, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.