Reciprocal lattice mapping of InGaAs layers grown on InP (001) and GaAs (001) substrates

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3725, Issue , 1999, Pages 47-52

  Bak Misiuk, J ^a   Kaniewski, J ^a   Domagala, J ^a   Reginski, K ^a   Adamczewska, J ^a   Trela, J ^a  

^a POLISH ACADEMY OF SCIENCES   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; X RAY DIFFRACTION ANALYSIS;

INDIUM GALLIUM ARSENIDE; LATTICE MISMATCH; RECIPROCAL LATTICE MAPPING;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0032684267     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (13)