Temporal Phase Unwrapping with two or four images per time frame: A comparison

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3744, Issue , 1999, Pages 358-366

  van Brug, Hedser ^a   Somers, Peter A A M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; PHASE MEASUREMENT; SPECKLE; VIBRATIONS (MECHANICAL);

PHASE STEPPING; TEMPORAL PHASE UNWRAPPING;

INTERFEROMETRY;

EID: 0032683358     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)