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Volumn 79, Issue 8, 1999, Pages 511-517

In situ high-resolution electron microscopy observation of grain-boundary migration through ledge motion in an Al-Mg alloy

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; CRYSTAL LATTICES; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; POLYCRYSTALLINE MATERIALS; TENSILE TESTING; THERMAL EFFECTS;

EID: 0032683279     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008399176878     Document Type: Article
Times cited : (17)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.