Interconnect coupling noise in CMOS VLSI circuits

Proceedings of the International Symposium on Physical Design

Volumn , Issue , 1999, Pages 48-53

  Tang, Kevin T ^a   Friedman, Eby G ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC IMPEDANCE; INTEGRATED CIRCUIT LAYOUT; SPURIOUS SIGNAL NOISE;

INTERCONNECT COUPLING NOISE; PROPAGATION DELAY;

VLSI CIRCUITS;

EID: 0032683029     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/299996.300020     Document Type: Article

References (20)