Extending the pseudo-stuck-at fault model to provide complete IDDQ coverage

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 128-134

  Aitken, Robert C ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; COMBINATORIAL CIRCUITS; FAILURE ANALYSIS; FLIP FLOP CIRCUITS; MATHEMATICAL MODELS; STATISTICS;

LEAKAGE FAULTS; PSEUDO STUCK AT FAULT MODEL;

INTEGRATED CIRCUIT TESTING;

EID: 0032682920     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (21)