Full two-dimensional electroluminescent (EL) analysis of GaAs/AlGaAs HBTs

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1999, Pages 121-127

  Harris, M ^a   Wagner, B ^a   Halpern, S ^a   Dobbs, M ^a   Pagel, C ^a   Stuffle, B ^a   Henderson, J ^a   Johnson, K ^a  

^a GEORGIA TECH RESEARCH INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; CURRENT DENSITY; ELECTROLUMINESCENCE; INSPECTION; LIGHT EMITTING DIODES; OPTIMIZATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SOLID STATE LASERS; TWO DIMENSIONAL;

BASE EMITTER JUNCTIONS; DARK LINE DEFECTS; EMISSION MICROSCOPY;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0032682915     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (5)