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Volumn , Issue , 1999, Pages 204-210
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Calibration technique for MEMS membrane type strain sensors
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CALIBRATION;
PIEZOELECTRIC DEVICES;
SEMICONDUCTOR DOPING;
SENSITIVITY ANALYSIS;
SENSORS;
SILICON WAFERS;
THIN FILMS;
PIEZORESISTIVE STRAIN SENSORS;
MICROELECTROMECHANICAL DEVICES;
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EID: 0032682868
PISSN: 07496877
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (11)
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References (7)
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