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Volumn 9, Issue 2 PART 3, 1999, Pages 3825-3828

HTS SFQ T-Flip flop with directly coupled readout

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; BIT ERROR RATE; ELECTRIC POTENTIAL; FABRICATION; FLIP FLOP CIRCUITS; YTTRIUM BARIUM COPPER OXIDES;

EID: 0032682811     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783861     Document Type: Article
Times cited : (10)

References (6)
  • 4
    • 0032069210 scopus 로고    scopus 로고
    • Measurement of the dynamic error rate of a high temperature superconductor rapid single flux quantum comparator, Vol. 72, No. 18, pp. 2328, May 1998.
    • B. Ruck, B. Oelze, R. Dittmann, A. Engelhardt, E. Sodtke, W.E. Booij, and M.G. Blamire, "Measurement of the dynamic error rate of a high temperature superconductor rapid single flux quantum comparator," Appl. Phys. Lett., Vol. 72, No. 18, pp. 2328, May 1998.
    • Appl. Phys. Lett.
    • Ruck, B.1    Oelze, B.2    Dittmann, R.3    Engelhardt, A.4    Sodtke, E.5    Booij, W.E.6    Blamire, M.G.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.