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Volumn 15, Issue 16, 1999, Pages 5279-5284

Characterization of highly ordered MCM-41 silicas using X-ray diffraction and nitrogen adsorption

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; AMMONIUM COMPOUNDS; MOLECULAR STRUCTURE; NITROGEN; NUMERICAL METHODS; PHASE TRANSITIONS; POROSITY; SURFACE ACTIVE AGENTS; SYNTHESIS (CHEMICAL); X RAY POWDER DIFFRACTION;

EID: 0032682527     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la990179v     Document Type: Article
Times cited : (156)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.