Electroreduction of Co2+ and Ni2+ at III-V semiconductors and properties of the semiconductor/metal interfaces formed

Journal of the Electrochemical Society

Volumn 146, Issue 4, 1999, Pages 1412-1420

  Strubbe, K ^a   Vereecken, P M ^a   Gomes, W P ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; CYCLIC VOLTAMMETRY; ELECTROCHEMICAL ELECTRODES; ELECTRODEPOSITION; INTERFACES (MATERIALS); NICKEL; PH EFFECTS; REDUCTION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SOLUTIONS;

ELECTROCHEMICAL REDUCTION; ROTATING DISK VOLTAMMETRY; SATURATED CALOMEL ELECTRODE; SEMICONDUCTING GALLIUM PHOSPHIDE;

ELECTROCHEMISTRY;

EID: 0032682122     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1391779     Document Type: Article

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