Hydrogen diffusion and trapping in microcrystalline silicon

Solid State Phenomena

Volumn 69, Issue , 1999, Pages 571-576

  Ballutaud, D ^a   Lusson, L ^a   Boutry Forveille, A ^a   Lusson, A ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ANNEALING; BINDING ENERGY; DIFFUSION IN SOLIDS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN BOUNDARIES; HYDROGEN BONDS; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS;

ISOTHERMAL ANNEALING; MICROCRYSTALLINE SILICON;

SEMICONDUCTING SILICON;

EID: 0032681514     PISSN: 10120394     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4028/www.scientific.net/ssp.69-70.571     Document Type: Article

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