Low-cost on-line test for digital filters

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 446-451

  Bayraktaroglu, Ismet ^a   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC NETWORK SYNTHESIS; ERROR DETECTION; FREQUENCY RESPONSE; INVARIANCE; ONLINE SYSTEMS;

DESIGN CONSTRAINTS; FAULT DETECTION; INPUT VECTOR MONITORING TECHNIQUES; ONLINE TESTING; TIME EXTENDED INVARIANCE;

DIGITAL FILTERS;

EID: 0032681501     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)