Microscopic bulk damage in dielectric materials using nanojoule femtosecond laser pulses

IQEC, International Quantum Electronics Conference Proceedings

Volumn , Issue , 1999, Pages 232-

  Schaffer, Chris B ^a   Brodeur, Andre ^a   Nishimura, Nozomi ^a   Mazur, Eric ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; FUSED SILICA; HELIUM NEON LASERS; LASER PULSES; MORPHOLOGY; NONLINEAR OPTICS; TRANSPARENCY;

MICROSCOPIC BULK DAMAGE;

LASER OPTICS;

EID: 0032681414     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (5)