633 nm iodine-stabilized diode-laser frequency standard

Metrologia

Volumn 36, Issue 1, 1999, Pages 41-45

  Edwards, C S ^a   Barwood, G P ^a   Gill, P ^a   Rowley, W R C ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALLAN STANDARD DEVIATION; LASER FREQUENCY;

HELIUM NEON LASERS; NANOSTRUCTURED MATERIALS; PHASE SEPARATION; PHASE TRANSITIONS; SEMICONDUCTOR LASERS; STATISTICAL METHODS;

IODINE;

EID: 0032680108     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/36/1/7     Document Type: Article

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