To dynamical theory of electrothermal degradation and NDT of defects in metal-dielectric-metal (MDM) structures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3700, Issue , 1999, Pages 436-443

  Bogomol'nyi, Valentin M ^a  

^a MOSCOW INSTITUTE OF PHYSICS AND TECHNOLOGY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; DIELECTRIC FILMS; POLARIZATION; RESONANCE;

ELECTROTHERMAL DEGRADATION; METAL DIELECTRIC METAL STRUCTURES; THERMOSENSE;

NONDESTRUCTIVE EXAMINATION;

EID: 0032679712     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (24)