Emissivity measurement and temperature correction accuracy considerations

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3700, Issue , 1999, Pages 393-401

  Madding, Robert P ^a  

^a Inframetrics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; MAINTENANCE; OPACITY; TEMPERATURE;

EMISSIVITY MEASUREMENT; TEMPERATURE CORRECTION ACCURACY;

THERMOGRAPHY (TEMPERATURE MEASUREMENT);

EID: 0032679711     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (4)