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Volumn 3744, Issue , 1999, Pages 487-496
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Developing accurate quantified speckle shearing data
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFECTS;
INTERFEROMETERS;
NONDESTRUCTIVE EXAMINATION;
OPTICAL COLLIMATORS;
SPECKLE;
ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI);
INTERFEROMETRY;
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EID: 0032678972
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (2)
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References (10)
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