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Volumn 69, Issue , 1999, Pages 513-518
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Simulation of point defect diffusion in semiconductors
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFUSION IN SOLIDS;
INTERFACES (MATERIALS);
POINT DEFECTS;
RESIDUAL STRESSES;
SUBSTRATES;
SELF-INTERSTITIALS;
SEMICONDUCTING SILICON;
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EID: 0032678920
PISSN: 10120394
EISSN: None
Source Type: Conference Proceeding
DOI: 10.4028/www.scientific.net/ssp.69-70.513 Document Type: Article |
Times cited : (10)
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References (8)
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