Modular approach of a high current MOS compact model for circuit-level ESD simulation including transient gate coupling behavior

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1999, Pages 167-178

  Mergens, Markus ^a   Wilkening, Wolfgang ^a   Mettler, Stephan ^a   Wolf, Heinrich ^a   Fichtner, Wolfgang ^a  

^a ROBERT BOSCH GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CONVERGENCE OF NUMERICAL METHODS; ELECTRIC DISCHARGES; GATES (TRANSISTOR); MATHEMATICAL MODELS;

AVALANCHE MULTIPLICATION FACTOR; ELECTRO STATIC DISCHARGE; GATE COUPLING EFFECT;

MOSFET DEVICES;

EID: 0032678897     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (30)