Quantitative X-ray microanalysis of beryllium using a multilayer diffracting device

Journal of analytical atomic spectrometry

Volumn 14, Issue 3, 1999, Pages 377-380

  Kleykamp, Heiko ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BORON; BORON CARBIDE; IMPURITIES; LITHIUM COMPOUNDS; MICROANALYSIS; MOLYBDENUM; MULTILAYERS; SOLUBILITY; SPECTROMETERS; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

CHEMICAL SHIFT; MULTILAYER DIFFRACTING DEVICES; X RAY MICROANALYSIS;

BERYLLIUM;

EID: 0032678186     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a806747c     Document Type: Article

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