Characterisation of organic thin films by atomic force microscopy - Application of force vs. Distance analysis and other modes

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 618-622

  Gibson, C T ^a   Watson, G S ^a   Mapledoram, L D ^b   Kondo, H ^c   Myhra, S ^a,b  

^a GRIFFITH UNIVERSITY   (Australia)

^b RICARDO UK LTD   (United Kingdom)

^c SONY CORPORATION   (Japan)

Author keywords

Atomic force microscopy; Force distance analysis; Lipid layer; Surface structure; Thin film analysis; Wool fibre

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; IMAGE ANALYSIS; INTERFACES (MATERIALS); LIPIDS; MECHANICAL PROPERTIES; SUBSTRATES; SURFACE PROPERTIES; SURFACE STRUCTURE; WOOL FIBERS;

FILM THICKNESS; FORCE DISTANCE ANALYSIS; LIPID LAYERS; ORGANIC THIN FILMS; THIN FILM ANALYSIS; TOPOGRAPHICAL IMAGES;

THIN FILMS;

EID: 0032675574     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00877-0     Document Type: Article

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