Correlation of intermediate ion energy induced extended defect continuity to enhanced pinning potential in TL-2212 films

Materials Research Society Symposium - Proceedings

Volumn 504, Issue , 1999, Pages 177-182

  Provencio, P Newcomer ^a   Venturini, E L ^a   Doyle, B L ^a   Brice, D K ^a   Schone, H ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; COPPER; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; GOLD; HIGH TEMPERATURE SUPERCONDUCTORS; ION BOMBARDMENT; OXIDE SUPERCONDUCTORS; POINT DEFECTS; THALLIUM COMPOUNDS;

SOFTWARE PACKAGE TRIMRC; THALLIUM BARIUM CALCIUM COPPER OXIDE; VORTEX PINNING POTENTIAL;

SUPERCONDUCTING FILMS;

EID: 0032675078     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (24)