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Volumn 57, Issue 2, 1999, Pages 269-282

Energy transport and the drift diffusion equations as relaxation limits of the hydrodynamic model for semiconductors

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC FIELDS; HYDRODYNAMICS; PRESSURE; PROBLEM SOLVING; RELAXATION PROCESSES; TEMPERATURE;

EID: 0032674952     PISSN: 0033569X     EISSN: None     Source Type: Journal    
DOI: 10.1090/qam/1686190     Document Type: Article
Times cited : (67)

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