Composition and properties of thin solid films on porous silicon surface

Thin Solid Films

Volumn 343-344, Issue 1-2, 1999, Pages 335-337

  Monastyrskii, L ^a   Lesiv, T ^a   Olenych, I ^a  

^a IVAN FRANKO NATIONAL UNIVERSITY OF LVIV   (Ukraine)

Author keywords

AES; Composition; Ellipsometry; Polymer films PMA; Porous silicon; Surface thin film coating; TDSC

Indexed keywords

ACRYLICS; AUGER ELECTRON SPECTROSCOPY; ELLIPSOMETRY; PHOTOLUMINESCENCE; PLASTIC FILMS; PRECIPITATION (CHEMICAL); PROTECTIVE COATINGS; SURFACE PROPERTIES; SURFACE STRUCTURE; THIN FILMS;

POLYMETHACRYLIC ACID;

POROUS SILICON;

EID: 0032673823     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01597-1     Document Type: Article

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