Goodness-of-fit tests for type-I extreme-value APD 2-parameter Weibull distributions

IEEE Transactions on Reliability

Volumn 48, Issue 1, 1999, Pages 79-86

  Shimokawa, Toshiyuki ^a   Liao, Min ^a  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

Anderson Darling; Cramer von Mises; Critical values; Graphical plotting techniques; Kolmogorov Smirnov; Maximum likelihood estimators; Monte Carlo simulation; Power study

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; GRAPH THEORY; LEAST SQUARES APPROXIMATIONS; LIFE CYCLE; MAXIMUM LIKELIHOOD ESTIMATION; MONTE CARLO METHODS; PARAMETER ESTIMATION; SERVICE LIFE; WEIBULL DISTRIBUTION;

ANDERSON-DARLING (A-D) STATISTICS; CRAMER-VON MISES (C-M) STATISTICS; GRAPHICAL PLOTTING TECHNIQUES (PLT); KOLMOGOROV-SMIRNOV (K-S) STATISTICS;

RELIABILITY;

EID: 0032673597     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.765931     Document Type: Article

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