Sputter deposition of NiTi thin film exhibiting the SME at room temperatures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3675, Issue , 1999, Pages 252-266

  Ho, Ken ^a   Carman, Greg P ^a   Jardine, Peter ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUSTENITE; DIFFERENTIAL SCANNING CALORIMETRY; INTELLIGENT MATERIALS; MARTENSITE; NICKEL ALLOYS; SHAPE MEMORY EFFECT; SPUTTER DEPOSITION; TENSILE TESTING; THERMAL EFFECTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

NICKEL TITANIDE;

METALLIC FILMS;

EID: 0032673326     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (22)