Exact properties of demerit control charts

Journal of Quality Technology

Volumn 31, Issue 2, 1999, Pages 207-216

  Jones, L Allison ^a   Woodall, William H ^b   Conerly, Michael D ^b  

^a UNIVERSITY OF MIAMI   (United States)

^b UNIVERSITY OF ALABAMA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; POISSON DISTRIBUTION; PRODUCT DESIGN; RANDOM PROCESSES;

DEMERIT RATING SYSTEM;

QUALITY CONTROL;

EID: 0032673009     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.1999.11979915     Document Type: Article

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