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Volumn 34, Issue 4, 1999, Pages 795-799
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Distribution of the crystal modifications in polymorphous PbSe films revealed by microhardness measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
BARIUM COMPOUNDS;
CRYSTAL ORIENTATION;
DEPOSITION;
ELECTRON BEAMS;
EPITAXIAL GROWTH;
EVAPORATION;
LEAD COMPOUNDS;
PHASE TRANSITIONS;
POTASSIUM COMPOUNDS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
ELECTRON BEAM EVAPORATION;
HOT WALL EPITAXY;
MICROHARDNESS MEASUREMENT;
POLYMORPHOUS FILM;
MICROHARDNESS;
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EID: 0032672925
PISSN: 00222461
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1004529115175 Document Type: Article |
Times cited : (9)
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References (14)
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