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Volumn 60, Issue 3, 1999, Pages 385-392
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Comparison of the various thermal treatments of chemically deposited bismuth sulfide thin films and the effect on the structural and electrical properties
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CHARGE TRANSFER;
CRYSTAL DEFECTS;
CRYSTALLIZATION;
DEPOSITION;
ELECTRIC CONDUCTIVITY OF SOLIDS;
PHOTOCONDUCTIVITY;
PRECIPITATION (CHEMICAL);
PRESSURE EFFECTS;
SEMICONDUCTING BISMUTH COMPOUNDS;
THERMAL EFFECTS;
THIN FILMS;
BISMUTH SULFIDE;
CHALCOGENIDES;
SEMICONDUCTING FILMS;
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EID: 0032672757
PISSN: 00223697
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3697(98)00271-6 Document Type: Article |
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Times cited : (23)
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References (10)
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