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Volumn 9, Issue 3, 1999, Pages 120-122

Impulse Response Measurements with 50-GHz Bandwidth

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CATHODE RAY OSCILLOSCOPES; IMPULSE RESPONSE; INTEGRATED CIRCUIT TESTING; LASER PULSES; MICROWAVE DEVICES; PHOTODETECTORS; RING LASERS; SEMICONDUCTOR LASERS;

EID: 0032672530     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.761680     Document Type: Article
Times cited : (4)

References (8)
  • 2
    • 0026941658 scopus 로고
    • Optoelectronic transient charcterization of ultrafast devices
    • M. Y. Frankel, J. F. Whitaker, and G. A. Mourou, “Optoelectronic transient charcterization of ultrafast devices,” IEEE J. Quantum Electron., vol. 28, pp. 2313-2324, 1992
    • (1992) IEEE J. Quantum Electron. , vol.28 , pp. 2313-2324
    • Frankel, M.Y.1    Whitaker, J.F.2    Mourou, G.A.3
  • 4
    • 0025432120 scopus 로고
    • Picosecond optics and microwave technology
    • C. H. Lee, “Picosecond optics and microwave technology,” IEEE Trans. Microwave Theory Tech., vol. 38, pp. 596-607, 1990
    • (1990) IEEE Trans. Microwave Theory Tech. , vol.38 , pp. 596-607
    • Lee, C.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.