Characterization of a thin film phantom for contrast and resolution measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3658, Issue , 1999, Pages 530-537

  McAleavey, Stephen A ^a   Naum, Robert G ^a   Parker, Kevin J ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; IMAGE PROCESSING; IMAGE QUALITY; MEDICAL IMAGING; TISSUE;

HALFTONING; PHANTOM;

ULTRASONIC IMAGING;

EID: 0032672073     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.349465     Document Type: Conference Paper

References (6)