Effect of the detector resolution on the Doppler broadening measurements of both valence and core electron-positron annihilation

Applied Surface Science

Volumn 149, Issue 1, 1999, Pages 234-237

  Ghosh, V J ^a   Nielsen, B ^a   Kruseman, A C ^b   Mijnarends, P E ^b   Van Veen, A ^b   Lynn, K G ^c  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; DOPPLER EFFECT; ELECTRON ENERGY LEVELS; POSITRONS;

ELECTRON-POSITRON ANNIHILATION; FULL WIDTH AT HALF MAXIMUM (FWHM);

SURFACE STRUCTURE;

EID: 0032671832     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00207-X     Document Type: Article

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