Development of practical damage-mapping and inspection systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3492, Issue II, 1999, Pages 556-563

  Rainer, F ^a   Dickson, R K ^a   Jennings, R T ^a   Kimmons, J F ^a   Maricle, S M ^a   Mouser, R P ^a   Schwartz, S ^a   Weinzapfel, C L ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LASER OPTICS; SUBSTRATES;

DAMAGE AND ARTIFACT MAPPING OF COHERENT-LASER EXPOSED SUBSTRATES; DAMAGE MAPPING;

LASER DAMAGE;

EID: 0032671257     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.354169     Document Type: Conference Paper

References (2)