Characterization of platinum-rutheniun electrodeposits using XRD, AES and XPS analysis

Journal of Electroanalytical Chemistry

Volumn 461, Issue 1-2, 1999, Pages 32-39

  Cattaneo, C ^a   Sanchez De Pinto, M I ^a   Mishima, H ^a   De Lopez Mishima B A ^a   Lescano, D ^b   Cornaglia, L ^c  

^a UNIVERSIDAD NACIONAL DE SANTIAGO DEL ESTERO   (Argentina)

^b UNIVERSIDAD NACIONAL DE CÓRDOBA   (Argentina)

^c UNIVERSIDAD NACIONAL DEL LITORAL   (Argentina)

Author keywords

AES; Pt Ru electrodeposits; X ray diffraction; XPS

Indexed keywords

CATALYST ACTIVITY; CRYSTAL GROWTH; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; ELECTRODEPOSITION; GOLD; METHANOL; OXIDATION; PLATINUM; RUTHENIUM; SOLID SOLUTIONS; TEXTURES;

FACE CENTERED CUBIC (FCC) STRUCTURE;

METALLIC FILMS;

EID: 0032671122     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(98)00196-X     Document Type: Article

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