Exploring silicon process technology through RIT's NPN BJT process

Biennial University/Government/Industry Microelectronics Symposium - Proceedings

Volumn , Issue , 1999, Pages 94-98

  Hirschman, Karl D ^a   Rack, Philip D ^a  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MICROELECTRONIC PROCESSING; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING; SILICON WAFERS;

SILICON PROCESS TECHNOLOGY;

ENGINEERING EDUCATION;

EID: 0032670441     PISSN: 07496877     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)