Critical current measurements on long BSCCO tapes using a contact-free method

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 2, 1999, Pages 1594-1597

  Bentzon, M D ^a   Vase, P ^a  

^a AMERICAN SUPERCONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); MAGNETIC FIELD MEASUREMENT; MAGNETIC SHIELDING; NONDESTRUCTIVE EXAMINATION; OXIDE SUPERCONDUCTORS; SUPERCONDUCTIVITY; TAPES;

CONTACT FREE METHOD; CRITICAL CURRENT MEASUREMENT; EXTERNAL MAGNETIC FIELD; MULTIFILAMENT TAPES; NON DESTRUCTIVENESS;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0032670395     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.784701     Document Type: Article

References (12)

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