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Volumn 15, Issue 16, 1999, Pages 5193-5196

Direct in situ observation of a lipid monolayer - DNA complex at the air - water interface by X-ray reflectometry

Author keywords

[No Author keywords available]

Indexed keywords

DNA; INTERFACES (MATERIALS); LIPIDS; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; STRUCTURE (COMPOSITION); SURFACE ROUGHNESS; X RAY ANALYSIS;

EID: 0032670302     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la981352a     Document Type: Article
Times cited : (63)

References (36)
  • 34
    • 0344297335 scopus 로고    scopus 로고
    • note
    • Program for calculation/analysis of X-ray reflectivity and fluorescence intensity from multilayered thin films in grazing incidence/exit X-ray experiments invented by Sakurai, K., National Research Institute for Metals, Tsukuba, Japan.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.